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 A Solution for Improving the Effectiveness of Higher Order Mutation Testing
Tác giả hoặc Nhóm tác giả: Do Van Nho; Nguyen Quang Vu; Nguyen Thanh Binh
Nơi đăng: Proceedings of The 2019 IEEE-RIVF International Conference on Computing and Communication Technologies; Số: ISBN: 978-1-5386-9313-1;Từ->đến trang: 202-206;Năm: 2019
Lĩnh vực: Chưa xác định; Loại: Bài báo khoa học; Thể loại: Quốc tế
TÓM TẮT
Testing plays a crucial role in software development for ensuring quality. Mutation testing in general and higher order mutation in particular are the good techniques to evaluate the quality of test data, i.e. determining if test data can uncover errors. However, higher order mutation is often very costly because of huge number of generated mutants. In this work, we focus on reducing the cost of higher order mutation testing. We propose different strategies to combine first order mutants to generate less number of higher order mutants for a program under test, but keep the quality of generated mutants. The proposed strategies are experimented on a set of different programs and the results show the effectiveness in terms of number generated mutants and mutation score.
ABSTRACT
Testing plays a crucial role in software development for ensuring quality. Mutation testing in general and higher order mutation in particular are the good techniques to evaluate the quality of test data, i.e. determining if test data can uncover errors. However, higher order mutation is often very costly because of huge number of generated mutants. In this work, we focus on reducing the cost of higher order mutation testing. We propose different strategies to combine first order mutants to generate less number of higher order mutants for a program under test, but keep the quality of generated mutants. The proposed strategies are experimented on a set of different programs and the results show the effectiveness in terms of number generated mutants and mutation score.
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